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Robert C. Aitken. Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 128-134, IEEE Computer Society, 1999. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: IDDQ testing as a component of a test suite: The need for several fault coverage metricsPeter C. Maxwell, Robert C. Aitken. et, 3(4):305-316, 1992. [doi]
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