Sami A. Al-Arian, Musaed A. Al-Kharji. Fault Simulation and Test Generation by Fault Sampling Techniques. In Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 92, Cambridge, MA, USA, October 11-14, 1992. pages 365-368, IEEE Computer Society, 1992.
@inproceedings{Al-ArianA92,
title = {Fault Simulation and Test Generation by Fault Sampling Techniques},
author = {Sami A. Al-Arian and Musaed A. Al-Kharji},
year = {1992},
tags = {testing},
researchr = {https://researchr.org/publication/Al-ArianA92},
cites = {0},
citedby = {0},
pages = {365-368},
booktitle = {Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 92, Cambridge, MA, USA, October 11-14, 1992},
publisher = {IEEE Computer Society},
isbn = {0-8186-3110-4},
}