Sami A. Al-Arian, Musaed A. Al-Kharji. Fault Simulation and Test Generation by Fault Sampling Techniques. In Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 92, Cambridge, MA, USA, October 11-14, 1992. pages 365-368, IEEE Computer Society, 1992.
Abstract is missing.