Transient Faults in DRAMs: Concepts, Analysis and Impact on Tests - researchr publication authors

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Zaid Al-Ars, A. J. van de Goor. Transient Faults in DRAMs: Concepts, Analysis and Impact on Tests. In 9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, CA, USA. pages 59-64, IEEE Computer Society, 2001. [doi]

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