Zaid Al-Ars, A. J. van de Goor. Transient Faults in DRAMs: Concepts, Analysis and Impact on Tests. In 9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, CA, USA. pages 59-64, IEEE Computer Society, 2001. [doi]
Abstract is missing.