Zaid Al-Ars, A. J. van de Goor. Approximating Infinite Dynamic Behavior for DRAM Cell Defects. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 401-406, IEEE Computer Society, 2002. [doi]
Abstract is missing.