Modeling Techniques and Tests for Partial Faults in Memory Devices - researchr publication authors

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Zaid Al-Ars, A. J. van de Goor. Modeling Techniques and Tests for Partial Faults in Memory Devices. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 89-93, IEEE Computer Society, 2002. [doi]

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