Zaid Al-Ars, A. J. van de Goor. Modeling Techniques and Tests for Partial Faults in Memory Devices. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 89-93, IEEE Computer Society, 2002. [doi]
@inproceedings{Al-ArsG02:1,
title = {Modeling Techniques and Tests for Partial Faults in Memory Devices},
author = {Zaid Al-Ars and A. J. van de Goor},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/date/2002/1471/00/14710089abs.htm},
tags = {modeling, testing},
researchr = {https://researchr.org/publication/Al-ArsG02%3A1},
cites = {0},
citedby = {0},
pages = {89-93},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1471-5},
}