Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev Richter. Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 783-792, IEEE Computer Society, 2001.
@inproceedings{Al-ArsGBR01:0,
title = {Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs},
author = {Zaid Al-Ars and A. J. van de Goor and Jens Braun and Detlev Richter},
year = {2001},
tags = {rule-based, analysis},
researchr = {https://researchr.org/publication/Al-ArsGBR01%3A0},
cites = {0},
citedby = {0},
pages = {783-792},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}