Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev Richter. Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 783-792, IEEE Computer Society, 2001.
Abstract is missing.