Zaid Al-Ars, Said Hamdioui, A. J. van de Goor. A Fault Primitive Based Analysis of Linked Faults in RAMs. In 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA. pages 33, IEEE Computer Society, 2003. [doi]
Abstract is missing.