Zaid Al-Ars, Said Hamdioui, A. J. van de Goor. Effects of Bit Line Coupling on the Faulty Behavior of DRAMs. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 117-122, IEEE Computer Society, 2004. [doi]
Abstract is missing.