Sultan M. Al-Harbi, Sandeep K. Gupta. Generating Complete and Optimal March Tests for Linked Faults in Memories. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 254-266, IEEE Computer Society, 2003. [doi]
@inproceedings{Al-HarbiG03,
title = {Generating Complete and Optimal March Tests for Linked Faults in Memories},
author = {Sultan M. Al-Harbi and Sandeep K. Gupta},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/vts/2003/1924/00/19240254abs.htm},
tags = {completeness, testing},
researchr = {https://researchr.org/publication/Al-HarbiG03},
cites = {0},
citedby = {0},
pages = {254-266},
booktitle = {21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1924-5},
}