Sultan M. Al-Harbi, Sandeep K. Gupta. Generating Complete and Optimal March Tests for Linked Faults in Memories. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 254-266, IEEE Computer Society, 2003. [doi]
Abstract is missing.