Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda. Should Illinois-Scan Based Architectures be Centralized or Distributed?. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 406-414, IEEE Computer Society, 2005. [doi]
Abstract is missing.