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MFBIST: A BIST Method for Random Pattern Resistant Circuits

Mohammed F. AlShaibi, Charles R. Kime. MFBIST: A BIST Method for Random Pattern Resistant Circuits. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 176-185, IEEE Computer Society, 1996.

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Mohammed F. AlShaibi

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Charles R. Kime

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