Mohammed F. AlShaibi, Charles R. Kime. MFBIST: A BIST Method for Random Pattern Resistant Circuits. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 176-185, IEEE Computer Society, 1996.
@inproceedings{AlShaibiK96,
title = {MFBIST: A BIST Method for Random Pattern Resistant Circuits},
author = {Mohammed F. AlShaibi and Charles R. Kime},
year = {1996},
researchr = {https://researchr.org/publication/AlShaibiK96},
cites = {0},
citedby = {0},
pages = {176-185},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}