Recycled FPGA Detection Using Exhaustive LUT Path Delay Characterization and Voltage Scaling

Md Mahbub Alam, Mark Tehranipoor, Domenic Forte. Recycled FPGA Detection Using Exhaustive LUT Path Delay Characterization and Voltage Scaling. IEEE Trans. VLSI Syst., 27(12):2897-2910, 2019. [doi]

@article{AlamTF19,
  title = {Recycled FPGA Detection Using Exhaustive LUT Path Delay Characterization and Voltage Scaling},
  author = {Md Mahbub Alam and Mark Tehranipoor and Domenic Forte},
  year = {2019},
  doi = {10.1109/TVLSI.2019.2933278},
  url = {https://doi.org/10.1109/TVLSI.2019.2933278},
  researchr = {https://researchr.org/publication/AlamTF19},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {27},
  number = {12},
  pages = {2897-2910},
}