Khaled Sidahmed Sidahmed Alamin, Yukai Chen, Sebastiano Gaiardelli, Stefano Spellini, Andrea Calimera, Alessandro Beghi, Gian Antonio Susto, Franco Fummi, Enrico Macii, Sara Vinco. SMART-IC: Smart Monitoring and Production Optimization for Zero-waste Semiconductor Manufacturing. In 23rd IEEE Latin American Test Symposium, LATS 2022, Montevideo, Uruguay, September 5-8, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.