Abstract is missing.
- On BTI Aging Rejuvenation in Memory Address DecodersCemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui. 1-6 [doi]
- Impact of Soft Errors on High Performance Autoencoders for Cyberattack DetectionFabrizio Finelli, Martin Omaña 0001, Cecilia Metra. 1-6 [doi]
- A Revised Isolation Forest procedure for Anomaly Detection with High Number of Data PointsElisa Marcelli, Tommaso Barbariol, Vincenzo Savarino, Alessandro Beghi, Gian Antonio Susto. 1-5 [doi]
- Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based MethodClayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen. 1-6 [doi]
- Reliability Assessment Methodologies for ANN-based SystemsAnnachiara Ruospo. 1-4 [doi]
- Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process VariationsVíctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas 0001, Jaume Segura 0001. 1-6 [doi]
- A Temperature Independent Readout Circuit for ISFET-Based Sensor ApplicationsElmira Moussavi, Dominik Sisejkovic, Animesh Singh, Daniyar Kizatov, Rainer Leupers, Sven Ingebrandt, Vivek Pachauri, Farhad Merchant. 1-4 [doi]
- Risk Assessment and Prediction in Human-Robot Interaction Through Assertion Mining and Pose EstimationMichele Boldo, Nicola Bombieri, Mirco De Marchi, Luca Geretti, Samuele Germiniani, Graziano Pravadelli. 1-5 [doi]
- On the SCA Resistance of Crypto IP CoresZoya Dyka, Ievgen Kabin, Marcin Brzozowski, Goran Panic, Cristiano Calligaro, Milos Krstic, Peter Langendoerfer. 1-2 [doi]
- Fast and Exact is Doable: Polynomial Algorithms in Test and VerificationRolf Drechsler. 1-2 [doi]
- Hybrid De-Embedding for 116 Gbps Test ChannelsZahrein Bin Yaacob, Chooi Yee Kong. 1-4 [doi]
- Prediction of the Impact of Approximate Computing on Spiking Neural Networks via Interval ArithmeticSepide Saeedi, Alessio Carpegna, Alessandro Savino, Stefano Di Carlo. 1-6 [doi]
- A Brief Review of Logarithmic Multiplier DesignsTingting Zhang, Zijing Niu, Jie Han 0001. 1-4 [doi]
- Spin Orbit Torque-based Crossbar Array for Error Resilient Binary Convolutional Neural NetworkKamal Danouchi, Guillaume Prenat, Lorena Anghel. 1-6 [doi]
- Assertion-aware approximate computing design exploration on behavioral modelsAlberto Bosio, Moreno Bragaglio, Samuele Germiniani, Samuele Mori, Graziano Pravadelli, Marcello Traiola. 1-6 [doi]
- SMART-IC: Smart Monitoring and Production Optimization for Zero-waste Semiconductor ManufacturingKhaled Sidahmed Sidahmed Alamin, Yukai Chen, Sebastiano Gaiardelli, Stefano Spellini, Andrea Calimera, Alessandro Beghi, Gian Antonio Susto, Franco Fummi, Enrico Macii, Sara Vinco. 1-6 [doi]
- Exploring an On-Chip Sensor to Detect Unique Faults in RRAMsThiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls. 1-6 [doi]
- A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-ChipGiusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre. 1-6 [doi]
- The Challenges of Coupling Digital-Twins with Multiple Classes of FaultsFrancesco Tosoni, Nicola Dall'Ora, Enrico Fraccaroli, Franco Fummi. 1-6 [doi]
- Laser Fault Injection Attacks against Radiation Tolerant TMR RegistersDmytro Petryk, Zoya Dyka, Ievgen Kabin, Anselm Breitenreiter, Jan Schäffner, Milos Krstic. 1-2 [doi]
- Security and Quantum Computing: An OverviewPrasanna Ravi, Anupam Chattopadhyay, Shivam Bhasin. 1-6 [doi]
- Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG ToolLucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen. 1-6 [doi]