Clayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen. Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. In 23rd IEEE Latin American Test Symposium, LATS 2022, Montevideo, Uruguay, September 5-8, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.