Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire. Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 47-52, IEEE Computer Society, 2008. [doi]
@inproceedings{Aldrete-VidrioSAGMMCRRCD08,
title = {Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers},
author = {Eduardo Aldrete-Vidrio and M. Amine Salhi and Josep Altet and Stéphane Grauby and Diego Mateo and H. Michel and L. Clerjaud and Jean-Michel Rampnoux and Antonio Rubio and Wilfrid Claeys and Stefan Dilhaire},
year = {2008},
doi = {10.1109/ETS.2008.15},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2008.15},
researchr = {https://researchr.org/publication/Aldrete-VidrioSAGMMCRRCD08},
cites = {0},
citedby = {0},
pages = {47-52},
booktitle = {13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3150-2},
}