Wilfrid Claeys - researchr alias

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Viewing Publication 1 - 18 from 18

2014

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiersJosep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà. mj, 45(5):484-490, 2014. [doi]

2009

Joule expansion imaging techniques on microlectronic devicesStéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire. mj, 40(9):1367-1372, 2009. [doi]

2008

2006

Dynamic Surface Temperature Measurements in ICsJosep Altet, Wilfrid Claeys, Stefan Dilhaire, Antonio Rubio. pieee, 94(8):1519-1533, 2006. [doi]

Time gating imaging through thick silicon substrate: a new step towards backside characterisationJ. M. Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire. mr, 46(9-11):1520-1524, 2006. [doi]

2005

ElectroStatic Discharge Fault Localization by Laser ProbingStéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire. mr, 45(9-11):1482-1486, 2005. [doi]

2004

Applications of temperature phase measurements to IC testingJosep Altet, J. M. Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby. mr, 44(1):95-103, 2004. [doi]

Strain energy imaging of a power MOS transistor using speckle interferometryStefan Dilhaire, Stéphane Grauby, S. Jorez, Wilfrid Claeys. tr, 53(2):293-296, 2004. [doi]

Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopyStefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale. mj, 35(10):811-816, 2004. [doi]

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscopeLuis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz. mj, 35(10):797-803, 2004. [doi]

2003

2001

Thermal coupling in integrated circuits: application to thermal testingJosep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys. jssc, 36(1):81-91, 2001. [doi]

Laser diode COFD analysis by thermoreflectance microscopyStefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys. mr, 41(9-10):1597-1601, 2001. [doi]

2000

Thermal Testing: Fault Location StrategiesJosep Altet, Antonio Rubio, E. Schaub, Stefan Dilhaire, Wilfrid Claeys. vts 2000: 189-194 [doi]

1999

Differential Thermal Testing: An Approach to its FeasibilityJosep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, E. Schaub, Hideo Tamamoto. et, 14(1-2):57-66, 1999. [doi]

Temperature measurements of metal lines under current stress by high-resolution laser probingVéronique Quintard, Stefan Dilhaire, Tam Phan, Wilfrid Claeys. tim, 48(1):69-74, 1999. [doi]

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