Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire. Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 47-52, IEEE Computer Society, 2008. [doi]
Abstract is missing.