Laser diode COFD analysis by thermoreflectance microscopy

Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys. Laser diode COFD analysis by thermoreflectance microscopy. Microelectronics Reliability, 41(9-10):1597-1601, 2001. [doi]

Abstract

Abstract is missing.