Mentor Graphics DFT to Navigate Nanometer Test Challenges

Greg Aldrich, Ron Press, Takeo Kobayashi, Tatsuo Sakajiri. Mentor Graphics DFT to Navigate Nanometer Test Challenges. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 130, IEEE, 2006. [doi]

Abstract

Abstract is missing.