Gerold Alfs, Reiner W. Hartenstein, Andrea Wodtko. The KARL/KARATE system - integrating functional test development into a CAD environment for VLSI. In Computer Design: VLSI in Computers and Processors, ICCD 1988., Proceedings of the 1988 IEEE International Conference on, Rye Brook, NY, USA, October 3-5, 1988. pages 209-212, IEEE, 1988. [doi]
Abstract is missing.