Sk Subidh Ali, Samah Mohamed Saeed, Ozgur Sinanoglu, Ramesh Karri. Novel Test-Mode-Only Scan Attack and Countermeasure for Compression-Based Scan Architectures. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(5):808-821, 2015. [doi]
@article{AliSSK15,
title = {Novel Test-Mode-Only Scan Attack and Countermeasure for Compression-Based Scan Architectures},
author = {Sk Subidh Ali and Samah Mohamed Saeed and Ozgur Sinanoglu and Ramesh Karri},
year = {2015},
doi = {10.1109/TCAD.2015.2398423},
url = {http://dx.doi.org/10.1109/TCAD.2015.2398423},
researchr = {https://researchr.org/publication/AliSSK15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {34},
number = {5},
pages = {808-821},
}