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Novel Test-Mode-Only Scan Attack and Countermeasure for Compression-Based Scan Architectures

Sk Subidh Ali, Samah Mohamed Saeed, Ozgur Sinanoglu, Ramesh Karri. Novel Test-Mode-Only Scan Attack and Countermeasure for Compression-Based Scan Architectures. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(5):808-821, 2015. [doi]

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