Testability analysis and behavioral testing of the Hopfield neural paradigm

Cesare Alippi, Franco Fummi, Vincenzo Piuri, Mariagiovanna Sami, Donatella Sciuto. Testability analysis and behavioral testing of the Hopfield neural paradigm. IEEE Trans. VLSI Syst., 6(3):507-511, 1998. [doi]

Abstract

Abstract is missing.