Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies - researchr publication

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Gerard A. Allan, Anthony J. Walton. Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. In The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. pages 88-96, IEEE Computer Society, 1994.

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