Nicholas Allec, Zyad Hassan, Li Shang, Robert P. Dick, Ronggui Yang. ThermalScope: multi-scale thermal analysis for nanometer-scale integrated circuits. In Sani R. Nassif, Jaijeet S. Roychowdhury, editors, 2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA. pages 603-610, IEEE, 2008. [doi]
Abstract is missing.