Compaction-based concurrent error detection for digital circuits

Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris. Compaction-based concurrent error detection for digital circuits. Microelectronics Journal, 36(9):856-862, 2005. [doi]

Authors

Sobeeh Almukhaizim

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Petros Drineas

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Yiorgos Makris

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