Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris. Compaction-based concurrent error detection for digital circuits. Microelectronics Journal, 36(9):856-862, 2005. [doi]
@article{AlmukhaizimDM05,
title = {Compaction-based concurrent error detection for digital circuits},
author = {Sobeeh Almukhaizim and Petros Drineas and Yiorgos Makris},
year = {2005},
doi = {10.1016/j.mejo.2005.03.009},
url = {http://dx.doi.org/10.1016/j.mejo.2005.03.009},
tags = {rule-based},
researchr = {https://researchr.org/publication/AlmukhaizimDM05},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {36},
number = {9},
pages = {856-862},
}