Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris. On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 123-128, IEEE, 2008. [doi]
Abstract is missing.