B. Alorda, Ivan de Paúl, Jaume Segura, T. Miller. On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor. In 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain. pages 87-91, IEEE Computer Society, 2000. [doi]
Abstract is missing.