Ihsen Alouani, Anouar Ben Khalifa, Farhad Merchant, Rainer Leupers. An Investigation on Inherent Robustness of Posit Data Representation. In 34th International Conference on VLSI Design and 20th International Conference on Embedded Systems, VLSID 2021, Guwahati, India, February 20-24, 2021. pages 276-281, IEEE, 2021. [doi]
Abstract is missing.