External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Impact of device geometry of the fin Electron-Hole Bilayer Tunnel FET

Cem Alper, Jose L. Padilla, Pierpaolo Palestri, Adrian M. Ionescu. Impact of device geometry of the fin Electron-Hole Bilayer Tunnel FET. In 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, September 12-15, 2016. pages 307-310, IEEE, 2016. [doi]

Authors

Cem Alper

This author has not been identified. Look up 'Cem Alper' in Google

Jose L. Padilla

This author has not been identified. Look up 'Jose L. Padilla' in Google

Pierpaolo Palestri

This author has not been identified. It may be one of the following persons: Look up 'Pierpaolo Palestri' in Google

Adrian M. Ionescu

This author has not been identified. Look up 'Adrian M. Ionescu' in Google
runs on