J. Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, A. Motta, Christian Pacha, A. Pagani, Alireza Rohani, R. Strasser. Thermal issues in test: An overview of the significant aspects and industrial practice. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-4, IEEE Computer Society, 2016. [doi]
Abstract is missing.