Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits

Josep Altet, Antonio Rubio, Hideo Tamamoto. Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 149-154, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.