Esteve Amat, E. Amatllé, Sergio Gómez, N. Aymerich, C. G. Almudéver, Francesc Moll, Antonio Rubio. Systematic and random variability analysis of two different 6T-SRAM layout topologies. Microelectronics Journal, 44(9):787-793, 2013. [doi]
Abstract is missing.