Esteve Amat, Ramon Canal, Antonio Rubio. Modem Gain-Cell Memories in Advanced Technologies. In Dimitris Gizopoulos, Dan Alexandrescu, Mihalis Maniatakos, Panagiota Papavramidou, editors, 24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018. pages 65-68, IEEE, 2018. [doi]
Abstract is missing.