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Focus Session: Advanced CMOS and 5.5D Packaging: Perspectives and Challenges for Design, Reliability and Security

Hussam Amrouch, Dragomir Milojevic, Giorgio Di Natale, Jérôme Toublanc. Focus Session: Advanced CMOS and 5.5D Packaging: Perspectives and Challenges for Design, Reliability and Security. In Design, Automation & Test in Europe Conference, DATE 2026, Verona, Italy, April 20-22, 2026. pages 1-6, IEEE, 2026. [doi]

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