Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel. Reliability Challenges with Self-Heating and Aging in FinFET Technology. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 68-71, IEEE, 2019. [doi]
@inproceedings{AmrouchSPKSTH19,
title = {Reliability Challenges with Self-Heating and Aging in FinFET Technology},
author = {Hussam Amrouch and Victor M. van Santen and Om Prakash and Hammam Kattan and Sami Salamin and Simon Thomann and Jörg Henkel},
year = {2019},
doi = {10.1109/IOLTS.2019.8854405},
url = {https://doi.org/10.1109/IOLTS.2019.8854405},
researchr = {https://researchr.org/publication/AmrouchSPKSTH19},
cites = {0},
citedby = {0},
pages = {68-71},
booktitle = {25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019},
editor = {Dimitris Gizopoulos and Dan Alexandrescu and Panagiota Papavramidou and Michail Maniatakos},
publisher = {IEEE},
isbn = {978-1-7281-2490-2},
}