M. Enamul Amyeen, Irith Pomeranz, Srikanth Venkataraman. A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 138-143, IEEE Computer Society, 2016. [doi]
@inproceedings{AmyeenPV16,
title = {A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction},
author = {M. Enamul Amyeen and Irith Pomeranz and Srikanth Venkataraman},
year = {2016},
doi = {10.1109/ATS.2016.15},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.15},
researchr = {https://researchr.org/publication/AmyeenPV16},
cites = {0},
citedby = {0},
pages = {138-143},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}