M. Enamul Amyeen, Irith Pomeranz, Srikanth Venkataraman. A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 138-143, IEEE Computer Society, 2016. [doi]
Abstract is missing.