26.3 Noise Immunity in Capacitive Sensing: Single-Ended AFE Design with Common-Current Subtraction for Mutual- and Self-Capacitance Sensing in 390pF Load

Junyeol An, Seung Hun Choi, Si-Woo Kim, Jae-Youl Lee, Hyung-Min Lee, Yoon Kyung Choi. 26.3 Noise Immunity in Capacitive Sensing: Single-Ended AFE Design with Common-Current Subtraction for Mutual- and Self-Capacitance Sensing in 390pF Load. In IEEE International Solid-State Circuits Conference, ISSCC 2024, San Francisco, CA, USA, February 18-22, 2024. pages 436-438, IEEE, 2024. [doi]

Authors

Junyeol An

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Seung Hun Choi

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Si-Woo Kim

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Jae-Youl Lee

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Hyung-Min Lee

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Yoon Kyung Choi

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