Junyeol An, Seung Hun Choi, Si-Woo Kim, Jae-Youl Lee, Hyung-Min Lee, Yoon Kyung Choi. 26.3 Noise Immunity in Capacitive Sensing: Single-Ended AFE Design with Common-Current Subtraction for Mutual- and Self-Capacitance Sensing in 390pF Load. In IEEE International Solid-State Circuits Conference, ISSCC 2024, San Francisco, CA, USA, February 18-22, 2024. pages 436-438, IEEE, 2024. [doi]
@inproceedings{AnCKLLC24,
title = {26.3 Noise Immunity in Capacitive Sensing: Single-Ended AFE Design with Common-Current Subtraction for Mutual- and Self-Capacitance Sensing in 390pF Load},
author = {Junyeol An and Seung Hun Choi and Si-Woo Kim and Jae-Youl Lee and Hyung-Min Lee and Yoon Kyung Choi},
year = {2024},
doi = {10.1109/ISSCC49657.2024.10454465},
url = {https://doi.org/10.1109/ISSCC49657.2024.10454465},
researchr = {https://researchr.org/publication/AnCKLLC24},
cites = {0},
citedby = {0},
pages = {436-438},
booktitle = {IEEE International Solid-State Circuits Conference, ISSCC 2024, San Francisco, CA, USA, February 18-22, 2024},
publisher = {IEEE},
isbn = {979-8-3503-0620-0},
}