Anthi Anastasiou, Yiorgos Tsiatouhas, Angela Arapoyanni. On the reuse of existing error tolerance circuitry for low power scan testing. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 1578-1581, IEEE, 2015. [doi]
Abstract is missing.