Steep coverage-ascent directed test generation for shared-memory verification of multicore chips

Gabriel A. G. Andrade, Marleson Graf, NĂ­colas Pfeifer, Luiz C. V. dos Santos. Steep coverage-ascent directed test generation for shared-memory verification of multicore chips. In Iris Bahar, editor, Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018. pages 29, ACM, 2018. [doi]

@inproceedings{AndradeGPS18,
  title = {Steep coverage-ascent directed test generation for shared-memory verification of multicore chips},
  author = {Gabriel A. G. Andrade and Marleson Graf and NĂ­colas Pfeifer and Luiz C. V. dos Santos},
  year = {2018},
  doi = {10.1145/3240765.3240852},
  url = {https://doi.org/10.1145/3240765.3240852},
  researchr = {https://researchr.org/publication/AndradeGPS18},
  cites = {0},
  citedby = {0},
  pages = {29},
  booktitle = {Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018},
  editor = {Iris Bahar},
  publisher = {ACM},
  isbn = {978-1-4503-5950-4},
}