Gabriel A. G. Andrade, Marleson Graf, NĂcolas Pfeifer, Luiz C. V. dos Santos. Steep coverage-ascent directed test generation for shared-memory verification of multicore chips. In Iris Bahar, editor, Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018. pages 29, ACM, 2018. [doi]
@inproceedings{AndradeGPS18, title = {Steep coverage-ascent directed test generation for shared-memory verification of multicore chips}, author = {Gabriel A. G. Andrade and Marleson Graf and NĂcolas Pfeifer and Luiz C. V. dos Santos}, year = {2018}, doi = {10.1145/3240765.3240852}, url = {https://doi.org/10.1145/3240765.3240852}, researchr = {https://researchr.org/publication/AndradeGPS18}, cites = {0}, citedby = {0}, pages = {29}, booktitle = {Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018}, editor = {Iris Bahar}, publisher = {ACM}, isbn = {978-1-4503-5950-4}, }